Boundary Condition Independence of Cauer RC … Condition Independence ,, , of Cauer RC Ladder ......
Transcript of Boundary Condition Independence of Cauer RC … Condition Independence ,, , of Cauer RC Ladder ......
Nanotechnology Conference and Expo NanotechWorkshop on Compact Modelling
Santa Clara, CA, USA, June 18-21, 2012
Boundary Condition Independence , , , ,
of Cauer RC Ladder Compact Thermal Modelsp
Marcin JANICKI, Tomasz TORZEWICZ, Zbigniew KULESZA, Andrzej NAPIERALSKI
Department of Microelectronics and Computer Science, Technical University of ŁódźWólczańska 221/223, 90-924 Lodz, Poland
e-mail: [email protected]
Technical University of ŁódźDepartment of Microelectronics and Computer Science
Presentation Plan
Generation of RC ladder compact thermal d lmodels thermal transient recording time constant spectrum thermal structure functions
Experimental investigation internal package structure identification thermal interface characterization cooling effectiveness assessment
Technical University of ŁódźDepartment of Microelectronics and Computer Science
Conclusions
RC Ladder Compact Thermal Models- DELPHI compact thermal models
(JEDEC JESD15-4) are generated in a complex way and their elementsin a complex way and their elements do not have any physical significance
- RC ladder models are more convenient for many practical engineering applications,e.g. for prediction of junction temperature in electro-thermal simulations
- RC ladder models might have physically significant model elements when generatedin a proper way employing the NetworkIdentification by Deconvolution method
Technical University of ŁódźDepartment of Microelectronics and Computer Science
RC Ladder Compact Thermal Modelsgeneration of accurate RC ladder models requires good quality
transient temperature measurements recorded on the logarithmically equidistant time scale hence allowing the identification of all thermal
time constants ranging from microseconds to hours
Technical University of ŁódźDepartment of Microelectronics and Computer Science
RC Ladder Compact Thermal Models
Technical University of ŁódźDepartment of Microelectronics and Computer Science
RC Ladder Compact Thermal Modelsthe thermal time constant spectrum identified after the deconvolution
represents a system in the form of distributed RC Foster ladder which cannot be physically correct because it implies the infinite speed
of temperature response propagation throughout the system
Technical University of ŁódźDepartment of Microelectronics and Computer Science
RC Ladder Compact Thermal Modelsthe Foster RC ladder needs to be converted to its Cauer counterpart
which could be physically correct, but for a large number of RC stages the conversion is numerically unstable
Technical University of ŁódźDepartment of Microelectronics and Computer Science
RC Ladder Compact Thermal Modelsafter the conversion to the RC Cauer ladder it is possible to construct cumulative thermal structure functions reflecting the entire heat flow
path from the junction to the ambient
Technical University of ŁódźDepartment of Microelectronics and Computer Science
RC Ladder Compact Thermal Models
cumulative differential
Technical University of ŁódźDepartment of Microelectronics and Computer Science
structure function
RC Ladder Compact Thermal Modelsour approach is to discretize the heat flow path into individual regions already at the stage of the time constant spectrum and then to convert it to the Cauer form which is a more numerically stable operation and
it can be done in a simple spreadsheet
the discretisation should be done at the locations of the minima in the time constant spectra which correspond to the change of a material
in a heat flow path
Technical University of ŁódźDepartment of Microelectronics and Computer Science
Experimental ResultsCASE 1
Dual SiC power diode in TO-247 package
Considered cooling configurations:
-still air cooling-package submerged in a recipient with water-device with a loosely attached multifinned heat sink-device with a tightly attached multifinned heat sink
Technical University of ŁódźDepartment of Microelectronics and Computer Science
Experimental Results
1E+2in air in water loose sink tight sink
1E+1se [K
]
1E+0pera
ture
ris
1E+0
Tem
p
1E-11E-4 1E-3 1E-2 1E-1 1E+0 1E+1 1E+2 1E+3 1E+4
Time [s]
d d h tiTechnical University of Łódź
Department of Microelectronics and Computer Science
recorded heating curves
Experimental Results1E+5
in air in water loose sink tight sink
1E+2
1E+3
1E+4
1E 1
1E+0
1E+1
Cth
[J/K
]
1E-1
1E+0
1E-3
1E-2
1E-1
1E 4
1E-3
1E-2
1E-40 5 10 15 20 25 30 35 40
Rth [K/W]
1E-40 1 2 3
l ti t t f tiTechnical University of Łódź
Department of Microelectronics and Computer Science
cumulative structure functions
Experimental Results
1E+1
in air in water loose sink tight sink
1E+0
1E-2
1E-1
R[K
/W]
1E-3
R
1E-41E-4 1E-3 1E-2 1E-1 1E+0 1E+1 1E+2 1E+3 1E+4
[s]
ti t t tTechnical University of Łódź
Department of Microelectronics and Computer Science
time constant spectra
Experimental Resultsin air
(s) R (K/W) C (J/K) 2.87E-04 6.19E-01 4.64E-04 9 81E-03 1 73E+00 5 67E-03
- individual RC stages correspond to real heat flow path
9.81E 03 1.73E+00 5.67E 038.04E+00 4.72E+00 1.71E+00 5.62E+01 3.14E+01 1.79E+00
in water (s) R (K/W) C (J/K)
- improved cooling forces 1D heat flowand reduces temperature setting time
- possible estimation of package2.79E-04 6.95E-01 4.01E-046.19E-03 1.50E+00 4.13E-03 1.61E+01 5.05E+00 3.19E+00 1.42E+03 8.53E+00 1.67E+02
loose sink
possible estimation of packageor heat sink heat capacity
- assessment of thermal interfaceresistance or heat transfer coefficient(s) R (K/W) C (J/K)
2.81E-04 6.36E-01 4.42E-04 5.07E-03 1.47E+00 3.46E-03 1.11E+01 2.39E+00 4.62E+00 6 54E+02 3 45E+00 1 89E+02
resistance or heat transfer coefficient
6.54E+02 3.45E+00 1.89E+02tight sink
(s) R (K/W) C (J/K) 2.86E-04 6.87E-01 4.17E-04 2.69E-03 1.05E+00 2.57E-03
Technical University of ŁódźDepartment of Microelectronics and Computer Science
8.06E-01 7.92E-01 1.02E+007.76E+02 4.09E+00 1.90E+02
Experimental ResultsCASE 2
SiC power diodes in TO-220 packages
Considered cooling configuration:
-still air cooling with a tightly attached multifinned heat sink
adapted from M. Janicki, M. Zubert, A. Napieralski, “Generation of reduced thermal models of electronic systems from transient thermal response”, Proc. 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems EuroSimE, 18-20 April, 2011, Linz, Austria, pp. 1-4.
Technical University of ŁódźDepartment of Microelectronics and Computer Science
y p pp
Experimental Results
121314
D1 - MESD2 - MESD1 SIM
89
1011
e ris
e (K
)D1 - SIMD2 - SIM
4567
empe
ratu
re
0123Te
1E-5 1E-4 1E-3 1E-2 1E-1 1E+0 1E+1 1E+2
Time (s)
d d h tiTechnical University of Łódź
Department of Microelectronics and Computer Science
recorded heating curves
Experimental Results
1E+3
1E+4)
D1D2
1E+0
1E+1
1E+2
itanc
e (J
/K) D2
1E-2
1E-1
1E+0
rmal
cap
aci
l ti t t f ti1E-5
1E-4
1E-3
Ther
cumulative structure functions0.0 1.0 2.0 3.0 4.0 5.0
Thermal resistance (K/W)
l ti t t f tiTechnical University of Łódź
Department of Microelectronics and Computer Science
cumulative structure function
Experimental Results0.25
W)
D1D2
0.15
0.20st
ance
(K/W D2
0.10
herm
al re
sis
0.00
0.05Th
1E-5 1E-4 1E-3 1E-2 1E-1 1E+0 1E+1 1E+2 1E+3
Time constant (s)
ti t t tTechnical University of Łódź
Department of Microelectronics and Computer Science
time constant spectra
Experimental ResultsDiode 1
R C (s) (K/W) (J/K)
7.58E-04 8.62E-01 8.79E-04 1.72E-03 2.04E+00 8.44E-04 2 40E 01 9 24E 01 2 60E 012.40E-01 9.24E-01 2.60E-014.75E+00 4.32E-01 1.10E+01 6.21E+01 5.84E-01 1.06E+02
Diode 2Diode 2 R C
(s) (K/W) (J/K) 1.85E-04 2.50E-01 7.39E-043.32E-03 1.73E+00 1.92E-03 2.10E-01 7.86E-01 2.67E-01 4.98E+00 4.32E-01 1.15E+01
Technical University of ŁódźDepartment of Microelectronics and Computer Science
5.66E+01 5.05E-01 1.12E+02
Experimental ResultsCASE 3
Power amplifier in a 12-pin SIP packageConsidered cooling configurations:Considered cooling configurations:
-still air cooling with a loosely or tightly attachedltifi d h t i kmultifinned heat sink
-forced air cooling at different air velocity
adapted from M. Janicki, J. Banaszczyk, B. Vermeersch; G. De Mey, and A. Napieralski, “Generation of reduced thermal models of electronic systems from time constant spectra of transient temperature responses” Microelectronics Reliability Vol 51
Technical University of ŁódźDepartment of Microelectronics and Computer Science
transient temperature responses , Microelectronics Reliability, Vol. 51, Issue 8, August 2011, pp. 1351-1355, ISSN 0026-2714.
Experimental Resultsloose -mes tight-mes grease-mesloose -sim tight-sim grease-sim
50
60
70
e (K
)
30
40
50
pera
ture
ris
10
20
Tem
p
01E-6 1E-5 1E-4 1E-3 1E-2 1E-1 1E+0 1E+1 1E+2 1E+3 1E+4
Time (s)
d d liTechnical University of Łódź
Department of Microelectronics and Computer Science
recorded cooling curves
Experimental Results0 m/s-mes 1.5 m/s-mes 3 m/s-mes0 m/s-sim 1.5 m/s-sim 3 m/s-sim
40
50
se (K
)
20
30
pera
ture
ris
0
10Tem
p
01E-6 1E-5 1E-4 1E-3 1E-2 1E-1 1E+0 1E+1 1E+2 1E+3 1E+4
Time (s)
d d liTechnical University of Łódź
Department of Microelectronics and Computer Science
recorded cooling curves
Experimental Results
1.0E+6loose tight grease
1.0E+31.0E+41.0E+5
1.0E+01.0E+11.0E+2
Cth
[J/K
]
1 0E 41.0E-31.0E-21.0E-1
1.0E-40 1 2 3 4 5 6 7 8
Rth [K/W]
l ti t t f tiTechnical University of Łódź
Department of Microelectronics and Computer Science
cumulative structure functions
Experimental Results1.0E+6
0.00 m/s 1.50 m/s 3.00 m/s
1.0E+3
1.0E+4
1.0E+5
1.0E+0
1.0E+1
1.0E+2
Cth
[J/K
]
1.0E-3
1.0E-2
1.0E-1
1.0E-40 1 2 3 4 5 6
Rth [K/W]
l ti t t f tiTechnical University of Łódź
Department of Microelectronics and Computer Science
cumulative structure functions
Experimental Results
1.4
loose tight grease
1.0
1.2
1.4W
]
0.6
0.8
Rth
[K/W
0.0
0.2
0.4
0.01.0E-3 1.0E-2 1.0E-1 1.0E+0 1.0E+1 1.0E+2 1.0E+3
Time constant [s]
ti t t tTechnical University of Łódź
Department of Microelectronics and Computer Science
time constant spectra
Experimental Results
0.350.00 m/s 1.50 m/s 3.00 m/s
0.25
0.30
0.15
0.20
Rth
[K/W
]
0 00
0.05
0.10
0.001.0E-3 1.0E-2 1.0E-1 1.0E+0 1.0E+1 1.0E+2 1.0E+3
Time constant [s]
ti t t tTechnical University of Łódź
Department of Microelectronics and Computer Science
time constant spectra
Experimental Resultsgrease tight loose
(s) R (K/W) C (J/K) (s) R (K/W) C (J/K) (s) R (K/W) C (J/K)( ) ( ) ( ) ( ) ( ) ( ) ( ) ( ) ( )
6.52 E-3 6.65 E-1 9.81 E-3 6.83 E-3 7.11 E-1 9.62 E-3 6.27 E-3 6.90 E-1 9.09 E-3
7.58 E-2 4.62 E-1 1.64 E-1 8.43 E-2 5.17 E-1 1.63 E-1 8.20 E-2 4.94 E-1 1.66 E-1
2 88 E+0 5 04 E-1 5 71 E+0 3 06 E+0 1 01 E-1 3 05 E+0 5 28 E+0 1 85 E+0 2 85 E+02.88 E+0 5.04 E 1 5.71 E+0 3.06 E+0 1.01 E 1 3.05 E+0 5.28 E+0 1.85 E+0 2.85 E+0
5.02 E+2 4.46 E+0 1.12 E+2 5.09 E+2 4.37 E+0 1.16 E+2 5.25 E+2 4.32 E+0 1.21 E+2
0.0 m/s 1.5 m/s 3.0 m/s
( ) R (K/W) C (J/K) ( ) R (K/W) C (J/K) ( ) R (K/W) C (J/K)(s) R (K/W) C (J/K) (s) R (K/W) C (J/K) (s) R (K/W) C (J/K)
8.50 E-3 9.63 E-1 8.83 E-3 8.23 E-3 8.70 E-1 9.46 E-3 7.56 E-3 8.27 E-1 9.15 E-3
7.48 E-2 4.01 E-1 1.87 E-1 6.96 E-2 4.27 E-1 1.63 E-1 6.85 E-2 4.14 E-1 1.66 E-1
2.91 E+0 5.03 E-1 5.77 E+0 2.86 E+0 4.52 E-1 6.34 E+0 2.82 E+0 4.08 E-1 6.91 E+0
3.91 E+2 3.30 E+0 1.18 E+2 1.58 E+2 1.36 E+0 1.16 E+2 1.04 E+2 8.91 E-1 1.16 E+2
Technical University of ŁódźDepartment of Microelectronics and Computer Science
Conclusions & Future Tasks logarithmically equidistant sampling of system thermal response
is the key issue in the identification of system time constant spectra; l h ll ti t t i l d d i d d th l d lonly when all time constants are included in reduced thermal models
the entire heat flow path from the junction to the ambient is properly characterized
opposed to the blind pole matching, the proposed method for the generation of reduced thermal models from time constant spectra allows for the physical interpretation of individual model elementallows for the physical interpretation of individual model element values
resulting reduced RC ladder thermal models of a system predict accurately junction temperature in dynamic states and they can be easily included in standard electrical simulators
Technical University of ŁódźDepartment of Microelectronics and Computer Science
Conclusions & Future Tasks conversion from Foster to Cauer network performed for a limited
number of RC stages is more numerically stable
generally Cauer RC ladder models are not boundary condition independent but not significant changes of boundary conditions can be taken into account without the necessity to regenerate thecan be taken into account without the necessity to regenerate the entire model
the NID method is developed based on a linear circuit theory thusspecial care must be taken when large temperature gradients occur
in future research both temperature and boundary condition dependence of RC ladder model elements should be investigateddependence of RC ladder model elements should be investigated in more detail
Technical University of ŁódźDepartment of Microelectronics and Computer Science
Technical University of ŁódźDepartment of Microelectronics and Computer Science