TR500 TR5700 IN LIN E - Terotest
2
SPECIFICATIONS Headquarters 7F., No.45, Dexing West Rd., Shilin Dist., Taipei City 11158, Taiwan TEL: +886-2-2832-8918 FAX: +886-2-2831-0567 E-Mail: [email protected] http://www.tri.com.tw Hsinchu, Taiwan 7F., No.47, Guangming 6th Rd., Zhubei City, Hsinchu County 30268, Taiwan TEL: +886-3-553-9796 FAX: +886-3-553-9786 USA 1923 Hartog Drive San Jose, CA 95131 U.S.A. TEL: +1-408-567-9898 FAX: +1-408-567-9288 E-mail: [email protected] Malaysia C11-1, Ground Floor, Lorong Bayan Indah 3 Bay Avenue, 11900 Bayan Lepas Penang, Malaysia TEL: +604-6461171 E-mail: [email protected] Europe O’Brien Strasse 14 91126 Schwabach Germany TEL: +49-9122-631-2127 FAX: +49-9122-631-2147 E-mail: [email protected] Japan 2-9-9 Midori, Sumida-ku, Tokyo, 130-0021 Japan TEL: +81-3- 6273-0518 FAX: +81-3- 6273-0519 E-mail: [email protected] Korea No.207 Daewoo-Technopia, 768-1 Wonsi-Dong, Danwon-Gu, Ansan City, Gyeonggi-Do, Korea TEL: +82-31-470-8858 FAX: +82-31-470-8859 E-mail: [email protected] Shenzhen, China 5F.3, Guangxia Road, Shang-mei- lin Area, Fu-Tian District, Shenzhen, Guangdong, 518049, China TEL: +86-755-83112668 FAX: +86-755-83108177 E-mail: [email protected] Suzhou, China 63 Huoju Road, Suzhou New District, 215009, China TEL: +86-512-68250001 FAX: +86-512-68096639 E-mail: [email protected] Shanghai, China W. 6F., Building18, 481 Guiping Road, Shanghai, 200233, China TEL: +86-21-54270101 FAX: +86-21-64957923 E-mail: [email protected] IN-CIRCUIT TESTER T R 5 0 0 1 I N L I N E I C T • AUTOMATED INLINE IN-CIRCUIT TEST SYSTEM • FULLY UPGRA DABLE FROM MDA TO ICT • COST-EFFECT IVE DIGITAL 1:1 DRIVER/REC EIVER PER PIN ARCHITECTU RE DESIGN • POWERFUL B OUNDARY SCAN TEST SOLUT IONS • EASY TO USE ON BOARD PROGRAMMI NG SOFTWARE TR5001 INLINE C-5001 INLINE-EN-1210 GENERAL Maximum Analog Test Points: 3200 or Maximum Digital Test Points: 1600 Operating System: Microsoft® Windows 2000/XP/Window 7 32Bit Power Requirement: 200-240V, Single Phase, 50/60Hz 3KVA Conforms to SMEMA standards Air Requirement: Dry Air 4–8kg/cm 2 , Air Consumption: 4 liters/cycle Fixture Type: Inline Testable PCB Size: Standard: (W) 360 mm x (D) 300 mm x (H) 0.6-5 mm Min. PCB Size: (W) 70 mm x (D) 70 mm Component Height Limitations: Top Surface of Conveyor: 90mm; Bottom Surface of Conveyor: 30mm ANALOG HARDWARE Measurement Switching Matrix: 6-wire measurement Programmable Frequency: 100Hz, 1KHz, 10KHz, 100KHz, 1MHz Programmable DC Voltage Source: ±10V max, Resolution: 6.1mV Programmable DC Current Source: +100mA max, Resolution: 0.2mA Programmable AC Voltage Source: 10Vpp max, Resolution: 6.1mV Programmable High Voltage DC Source: 43V@43mA max Component Measurement Capability Resistance: 1ohm–40Mohm Capacitance: 10pF–40mF Inductance: 10μH–60H Analog Measurement AC Voltmeter: 0–100V DC Voltmeter: 0–±100V; Resolution: 2.5mV–50mV DC Ampmeter: 1μA–160mA; Resolution: 30nA–30μA OPTIONAL HARDWARE Analog Test TestJet Technology: Vectorless open circuit detection Arbitrary Waveform Generator (AWG): Frequency Range 0–100KHz; Resolution: 0.15Hz Digital Test Non-multiplexing 1:1 per pin architecture Pin Drivers: Programmable levels 0.5V to 4V Pin Receivers: Programmable levels -5V to 5V Pull-up/Pull-down Resistor: 4.7K DUT Power Supplies: 5V@3A, 3.3V@3A, 12V@3A, 18V@3A, -12V@1A and 24V@3A Programmable DUT Power Supplies: 25V@ 8A, 75V@ 2.5A On-board Programming of Flash & EEPROM Memories MAC Address Programming: Supports MAC address programming with server supplied MAC address Boundary Scan: Includes B-Scan Chain Test, B-Scan Cluster Test, B-Scan Virtual Nails Test and IEEE1149.6 Test ToggleScan Test: Advanced test technology that combines with B-Scan and Vectorless test functions to detect pin open or short issues Tree Test Facilities with BGA Test: Pattern generator for detection of pin opens for BGA/VLSI chips DIMENSIONS & WEIGHT Dimensions: (W) 900 mm x (D) 900 mm x (H) 1640-1840 mm (not including signal tower, signal tower height: 515 mm) Weight: 500kg Conveyor Height: 890-1100 mm POWERFUL SOFTWARE ENVIRONMENT Microsoft® Windows operating system software; User-friendly interface Automatic Test Program Generator (ATPG) Automatic protection of specific points during debug Auto-learning and test program generation for opens/shorts clamping diode and TestJet tests Auto-debugging of passive components Built-in self-diagnostic function Board view displays test fail devices and pins instantly ToggleScan VregTest Specifications are subject to change without notice. All trademarks are the property of their owners. The following are trademarks or registered trademarks of Test Research, Inc. (TRI) The absence of a product or service name or logo from this list does not constitute a waiver of TRI’s trademark or other intellectual property rights concerning that name or logo. All other trademarks and trade names are the property of their owners. TR500 1 I N LI N E SERIES
Transcript of TR500 TR5700 IN LIN E - Terotest
S P E C I F I C A T I O N S
Headquarters7F., No.45, Dexing West Rd., Shilin Dist., Taipei City 11158, TaiwanTEL: +886-2-2832-8918FAX: +886-2-2831-0567E-Mail: [email protected]://www.tri.com.tw
Hsinchu, Taiwan7F., No.47, Guangming 6th Rd., Zhubei City, Hsinchu County 30268, TaiwanTEL: +886-3-553-9796 FAX: +886-3-553-9786
USA1923 Hartog DriveSan Jose, CA 95131 U.S.A.TEL: +1-408-567-9898FAX: +1-408-567-9288 E-mail: [email protected]
MalaysiaC11-1, Ground Floor, Lorong Bayan Indah 3 Bay Avenue, 11900 Bayan Lepas Penang, MalaysiaTEL: +604-6461171E-mail: [email protected]
EuropeO’Brien Strasse 1491126 SchwabachGermanyTEL: +49-9122-631-2127FAX: +49-9122-631-2147E-mail: [email protected]
Japan2-9-9 Midori, Sumida-ku, Tokyo, 130-0021 JapanTEL: +81-3- 6273-0518FAX: +81-3- 6273-0519E-mail: [email protected]
KoreaNo.207 Daewoo-Technopia, 768-1 Wonsi-Dong, Danwon-Gu, Ansan City, Gyeonggi-Do, KoreaTEL: +82-31-470-8858 FAX: +82-31-470-8859 E-mail: [email protected]
Shenzhen, China 5F.3, Guangxia Road, Shang-mei-lin Area, Fu-Tian District, Shenzhen, Guangdong, 518049, ChinaTEL: +86-755-83112668 FAX: +86-755-83108177 E-mail: [email protected]
Suzhou, China 63 Huoju Road, Suzhou New District, 215009, China TEL: +86-512-68250001FAX: +86-512-68096639E-mail: [email protected]
Shanghai, China W. 6F., Building18, 481 Guiping Road, Shanghai, 200233, ChinaTEL: +86-21-54270101FAX: +86-21-64957923E-mail: [email protected]
TR5700 SERIES
I N - C I R C U I T T E S T E R
T R 5 0 0 1 I N L I N E I C T
• A U T OM AT E D I N L I N E I N - C I R C U I T T E S T S Y S T E M
• FULLY UPGRADAB LE FR O M M DA TO I C T
• COS T- E FFEC T I V E D I G I T A L 1 : 1 D R I V E R / R E C E I V E R P E R P I N A R C H I T E C T U R E D E S I G N
• P OW E R FU L B O U N D A R Y S C A N T E S T S O L U T I O N S
• E A SY TO USE O N B O A R D P R O G R A M M I N G S O F T W A R E
TR5001 INLINE
C-5001 INLINE-EN-1210
G E N E R A LMaximum Analog Test Points: 3200 or Maximum Digital Test Points: 1600Operating System: Microsoft® Windows 2000/XP/Window 7 32BitPower Requirement: 200-240V, Single Phase, 50/60Hz 3KVA Conforms to SMEMA standardsAir Requirement: Dry Air 4–8kg/cm2, Air Consumption: 4 liters/cycleFixture Type: InlineTestable PCB Size: Standard: (W) 360 mm x (D) 300 mm x (H) 0.6-5 mmMin. PCB Size: (W) 70 mm x (D) 70 mm Component Height Limitations:Top Surface of Conveyor: 90mm; Bottom Surface of Conveyor: 30mm
A N A L O G H A R D W A R EMeasurement Switching Matrix: 6-wire measurementProgrammable Frequency: 100Hz, 1KHz, 10KHz, 100KHz, 1MHz Programmable DC Voltage Source: ±10V max, Resolution: 6.1mV Programmable DC Current Source: +100mA max, Resolution: 0.2mA Programmable AC Voltage Source: 10Vpp max, Resolution: 6.1mV Programmable High Voltage DC Source: 43V@43mA max
Component Measurement CapabilityResistance: 1ohm–40Mohm Capacitance: 10pF–40mFInductance: 10μH–60H
Analog MeasurementAC Voltmeter: 0–100VDC Voltmeter: 0–±100V; Resolution: 2.5mV–50mVDC Ampmeter: 1μA–160mA; Resolution: 30nA–30μA
O P T I O N A L H A R D W A R EAnalog TestTestJet Technology: Vectorless open circuit detectionArbitrary Waveform Generator (AWG): Frequency Range 0–100KHz; Resolution: 0.15Hz
Digital TestNon-multiplexing 1:1 per pin architecturePin Drivers: Programmable levels 0.5V to 4VPin Receivers: Programmable levels -5V to 5VPull-up/Pull-down Resistor: 4.7KDUT Power Supplies: 5V@3A, 3.3V@3A, 12V@3A, 18V@3A, -12V@1A and 24V@3AProgrammable DUT Power Supplies: 25V@ 8A, 75V@ 2.5AOn-board Programming of Flash & EEPROM MemoriesMAC Address Programming: Supports MAC address programming with server supplied MAC addressBoundary Scan: Includes B-Scan Chain Test, B-Scan Cluster Test, B-Scan Virtual Nails Test and IEEE1149.6 Test ToggleScan Test: Advanced test technology that combines with B-Scan and Vectorless test functions to detect pin open or short issuesTree Test Facilities with BGA Test: Pattern generator for detection of pin opens for BGA/VLSI chips
D I M E N S I O N S & W E I G H TDimensions: (W) 900 mm x (D) 900 mm x (H) 1640-1840 mm (not including signal tower, signal tower height: 515 mm)Weight: 500kgConveyor Height: 890-1100 mm
P O W E R F U L S O F T W A R E E N V I R O N M E N TMicrosoft® Windows operating system software; User-friendly interfaceAutomatic Test Program Generator (ATPG)Automatic protection of specific points during debugAuto-learning and test program generation for opens/shorts clamping diode and TestJet testsAuto-debugging of passive componentsBuilt-in self-diagnostic functionBoard view displays test fail devices and pins instantly
ToggleScan VregTest
Specifications are subject to change without notice. All trademarks are the property of their owners.
The following are trademarks or registered trademarks of Test Research, Inc. (TRI)
The absence of a product or service name or logo from this list does not constitute a waiver of TRI’s trademark or other intellectual property rights concerning that name or logo. All other trademarks and trade names are the property of their owners.
TR5001 INLINE SERIES
F E A T U R E S T R 5 0 0 1 I N L I N EF E A T U R E S T R 5 0 0 1 I N L I N E
N O A C C E S S S O L U T I O N• DriveThroughTest
• BoundaryScanTest
• TRIToggleScanTest TRI’s patented ToggleScan technology is the perfect solution for current and future generations of component-dense PCBAs with little or no test access. Fully compliant with the draft IEEE 1149.8.1 standard, ToggleScan provides maximum test coverage by detecting opens and shorts on many kinds of devices, including connectors, sockets, boundary scan and non-BScan chipsets, differential AC-coupled signal chipsets, resistor arrays and capacitor arrays.
• TRICPUSocketTest
• OptimalTestAnalyzer(OTA)
S H O P F L O O R S Y S T E M S U P P O R T• Supportstextfile,database,andDll interfaces
• S/NandoperatorIDcheck
• Multi-dataexchangeprotocol
I N L I N E F I X T U R E D E S I G N• Fast-insertion mechanism• Conforms to SMEMA standards• Dual stage press unit• Fast, easy fixture swap• Reduced labor costs• Increased productivity• Enhanced efficiency• Automatic test without human interruption• Test program compatibility with TR5001/TR5001E• Semi-automatic fixture Installation• PCBA protection mechanics
Boundary-Scan Virtual Test
A N A L O G T E S TH I G H P E R F O R M A N C E M A N U F A C T U R I N G D E F E C T S A N A L Y Z E R ( M D A )
R L C M E A S U R E M E N T• 6-WireMeasurement• Auto-GuardingFeature• ACPhaseMeasurement• High-SpeedTest
T E S T J E T T E C H N O L O G YDetects open connections on ICs, connectors and other SMT devices.
C A P A C I T O R P O L A R I T Y T E S T• LeakageCurrentMeasurement• TestJetDetection
T R A N S I S T O R / D I O D E M E A S U R E M E N T• Diode• ZenerDiode• Transistor:PNP,NPN• FET/SCR/TRIAC• PhotoCoupler
D I G I T A L T E S TF U L L D I G I T A L I N - C I R C U I T T E S T ( I C T )
U S E R F R I E N D L Y I N T E R F A C EThe TR5001 provides an easy to understand and flexible interface.• Colorsyntaxprogrameditor• C-liketestlanguage• Editablewaveformdisplaytool• Integrateddevelopment environment
E A S Y - T O - U S E O N - B O A R D P R O G R A M M I N G S O F T W A R E
Modularized memory algorithms on board programming.
• FlashProgramming
• SerialDeviceProgramming
P O W E R F U L B O U N D A R Y - S C A N C H A I N T E S T C A P A B I L I T Y
Auto-generation of test programs and
reports through the boundary scan Test
ProgramGenerator(BSTG)incorporate
different types of test categories like
individual boundary scan device tests,
boundary scan device chain tests, virtual
nail tests for RAM, ROM, TTL & TREE
devices, and IEEE1149.6 tests.
T H E M O S T C O S T - E F F E C T I V E T E S T S T R A T E G Y
Non-Multiplexing Pin Design; Driver/Receiver to Pin Ratio 1:1
• Optimizednailplacementwith1:1 ratio flexibility
• ECNsonlyrequiremovingfew existing wires compared with 2:8/2:9 driver/receiver per pin
• 1:1Driver/Receiverperpinprovide the fastest test program development and debugging
Waveform display
Flash programming
Color syntax program editor
Board view with trace display capacity
BScanChip
BScanChip
Non-BScanDevice
BScanChip
BScanChip
DUT
CAD
BOM
Generate AOIProgram
Generate ICTProgram
ICT test coverage report
SQLserver
Convertertool
AnalysisAgent
Program generator
RuleOTA system
Gerber
TR5001 Inline
TR7500 Series orTR7700 Series
Post Re-FlowInspection
ICT Board Testing
Test Server ICT Server
Insertion& Wave
Soldering
F/TStation
Re-FlowOven
FET Test Transistor Test
TestJet Technology
Vectorless Probe
JTAG
Output Pin drives a signal
to DUT
TRI Board Tester
No test probes needed to detect opens and shorts
TRI’s ToggleScan Test
BSCANChip
DUT - Connector/Socket - BScan Chip - non-BScan Chip - Capacitor Array - Resistor Array
Data Flow
ScreenPrint
Pick &Place
Re-FlowOven
Insertion& Wave
Soldering
DataInterface
IntelligentIntegrated S/W
with YMS
SFCServer
Feedback Flow
TR7007 Series TR7500 Series or TR7700 Series
TR7500 Series or TR7700 Series
TR518 Series TR5001 Inline Series TR8000 SeriesTR7600 Series
• Testersenableprocesscapabilitycontrol
• Real-timedefectinformationintegrationandanalysis• Defectknowledgemanagement*Optional
Y I E L D M A N A G E M E N T S Y S T E M *
(Can Hold 2Test Boards)
(Can Hold 2Test Boards)
(Can Hold 2Test Boards)
(Boa
rds 1
&2
Out
)
(Can Hold 2Test Boards)
(Can Hold 2Test Boards)
(Can Hold 2Test Boards)
(Boa
rds 1
&2
Out
)PCBOffloade
r
PCBOffloade
r
Conveyor Conveyor
ICTInline(Front)
Conveyor Conveyor
ICTInline(Front)
Conveyor
Conveyor
Conveyor
ICTInline(Front)
P R O D U C T I O N L A Y O U T M O T I O N
