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Kyoto Univ. Confidential 1 !"#$%&’!"#$%()* +, -. /01)1)23)456 [email protected] "013%&%"1S()S457-" !"!"#$%&$’( ToF (89:;<= >?< @AB< "013%&%"1S()S457-3 • )*+,-.,/0123 • $%&$43!56789)*+: • ;<=>?)*+: • @ABC)*+: • DE;F)*+: • G.HI)*+: • JK)*+LMN • OPQ+B • RSTFU • V;WXU CDEF#% "013%&%"1S()S457-+ GHI • DETYZ$%&$ [K)*+RSTYU/\],^3 _‘abc de ghijjk_lmcn &eoe $pqr_lmcn st uJ_vwcn [x yz_vwc • [K)*+RSTYU_{|c }~DEM _Oc • Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends A. Benninghoven, H. W. Werner, F.G. Rudenauer (Wiley Interscience) • ToF-SIMS: Surface Analysis by Mass Spectrometry John C Vickerman and David Briggs (IM Publications) • Cluster Secondary Ion Mass Spectrometry: Principles and Applications Christine M. Mahoney (Wiley)
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•Secondary Ion Mass Spectrometry:Basic Concepts, Instrumental Aspects, Applications and TrendsA. Benninghoven, H. W. Werner, F.G. Rudenauer (Wiley Interscience)
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